Scanning electron microscope image of sunflower lower leaf surface. This is part of an image series containing images CIL:39341-39343, and 39345.
Instrument: FEI XL-30 FEG ESEM. Technical protocol available at http://remf.dartmouth.edu:8080/EM-Wiki/36
Spatial Axis | Image Size | Pixel Size |
---|---|---|
X | 2576px | —— |
Y | 2056px | —— |